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Full-Energy Peak Efficiency of Asymmetrical Polyhedron Germanium Detector

Abstract

To un der stand the nu clear struc ture for most el e ments, it is es sen tial to in ves ti gate the nu clear ex citations by using high precision gamma-ray spectroscopy in which inten sive measurements should be car ried out. This is be com ing a new chal lenge for the ra di a tion sci en tific com mu - nity now a days, where the in stru men ta tions and tech ni cal ad vances must be de vel oped to be used in a wide range of ap pli ca tions. To dis cover the weak est nu clear re ac tion, the max i mum prob a bil ity of the de tec tion sys tem of the to tal en ergy of any re leased in di vid ual pho ton must be de ter mined. In this work, a new math e mat i cal method to cal cu late the ab so lute full-en ergy peak efficiency of asymmet rical polyhedron germanium detec tor is presented. This type of de - tec tor can be arranged in array, forming “complex detec tors of encap sulated germanium crys - tals”, with the solid an gle reach ing 82 % of to tal solid an gle cov er age, i. e., with the high est pos si ble ef fi ciency and with a good qual ity of spec tral re sponse. In ad di tion, the pho ton path length was en closed in the math e mat i cal method to de ter mine its at ten u a tion through dif fer - ent ma te ri als such as, the de tec tor ac tive me dium and any other ma te rial in-be tween source-detector system during the measur ing process. The comparison between the efficiency cal cu lated in this work and that of the pub lished Monte Carlo sim u la tion showed a good agree ment and a small vari a tion. How ever, the method dis cussed in the cur rent work can be use ful in nu clear safe guards, in over com ing the huge dif fi cul ties in iden ti fi ca tion of the en ergy range of ra dio ac tive iso topes and their quan ti ties in nu clear waste.

Author(s)

Mahmoud Abbas

Coauthor(s)

Sara Yoseph, Ahmed El Khatib, Mohamed Salem Badawi, Mona Gouda

Journal/Conference Information

Nu clear Tech nol ogy & Ra di a tion Pro tec tion,DOI: http://doi.org/10.2298/NTRP1802150A, ISSN: --, Volume: 33, Issue: 1, Pages Range: 150-158,