Investigation of The Dielectric Properties Of (Cu, Tl) 1234 Added
with Graphene
Abstract
Superconducting samples of type (Cu0.5Tl0.5)-1234 were prepared at normal pressure via one step of conventional
solid state reaction technique, and added with x wt.% of graphene (0≤x≤0.1). X-ray powder diffraction (XRD)
shows that the addition of graphene does not alter the tetragonal structure and the lattice parameters of the samples.
Fourier Transform Infrared (FTIR) measurements indicate the non-uniform distribution of graphene inside the
(Cu0.5Tl0.5)-1234 phase. While the Scanning Electron Microscope (SEM) images reveal the increase of the intergrain connectivity. The superconducting transition temperature Tc, obtained from Ac magnetic susceptibility
measurements, shows an enhancement up to x=0.04 Wt. %, followed by a deterioration for x >0.04. The frequency
dependence of the dielectric properties of the samples was experimentally investigated at different temperatures
(110 K ≤ T ≤ 260 K). The real and imaginary parts (ε' and ε'') of dielectric constant increase up to x=0.1. The study
of ε' and ε'', the dielectric loss (tan δ) and the ac-conductivity (σac) have shown that the variation of frequency,
temperature and addition of graphene allows the tuning of these parameters for various applications.
Coauthor(s)
Hadi Basma, M Anas
Journal/Conference Information
Modern Applied Science,DOI: doi:10.5539/mas.v13n4p12 , Volume: 13, Issue: -, Pages Range: 12-23,